Detection of the Displacement of Micro Touch Probes Using Structured Illumination

Article Properties
Cite
Dierke, Hanno, et al. “Detection of the Displacement of Micro Touch Probes Using Structured Illumination”. International Journal of Optomechatronics, vol. 7, no. 2, 2013, pp. 136-48, https://doi.org/10.1080/15599612.2013.785042.
Dierke, H., Fischer, M., Abd-Elmageed, A.-E., Nitsche, J. E., Schrader, C., & Tutsch, R. (2013). Detection of the Displacement of Micro Touch Probes Using Structured Illumination. International Journal of Optomechatronics, 7(2), 136-148. https://doi.org/10.1080/15599612.2013.785042
Dierke H, Fischer M, Abd-Elmageed AE, Nitsche JE, Schrader C, Tutsch R. Detection of the Displacement of Micro Touch Probes Using Structured Illumination. International Journal of Optomechatronics. 2013;7(2):136-48.
Journal Categories
Science
Physics
Optics
Light
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
Technology
Engineering (General)
Civil engineering (General)
Technology
Engineering (General)
Civil engineering (General)
Applied optics
Photonics
Technology
Mechanical engineering and machinery
Refrences
Title Journal Journal Categories Citations Publication Date
Optical Shop Testing, 2006
Realization and calibration of the "Isara 400" ultra-precision CMM Journal of Physics: Conference Series 13 2011
10.1016/S0167-9317(99)00006-4
Simulation, fabrication and characterization of a 3D piezoresistive force sensor Sensors and Actuators A: Physical
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Mathematics: Instruments and machines
  • Technology: Engineering (General). Civil engineering (General)
31 2008
Calibration of a microprobe array Measurement Science and Technology
  • Technology: Engineering (General). Civil engineering (General)
  • Science: Mathematics: Instruments and machines
  • Science: Chemistry: Analytical chemistry
  • Technology: Engineering (General). Civil engineering (General)
1 2012