Edge Extraction by an Exponential Function Considering X-ray Transmission Characteristics

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Kim, Jong Hyeong, et al. “Edge Extraction by an Exponential Function Considering X-Ray Transmission Characteristics”. International Journal of Optomechatronics, vol. 5, no. 2, 2011, pp. 136-54, https://doi.org/10.1080/15599612.2011.581741.
Kim, J. H., Synn, S. Y., Cho, S. M., & Joo, W. J. (2011). Edge Extraction by an Exponential Function Considering X-ray Transmission Characteristics. International Journal of Optomechatronics, 5(2), 136-154. https://doi.org/10.1080/15599612.2011.581741
Kim JH, Synn SY, Cho SM, Joo WJ. Edge Extraction by an Exponential Function Considering X-ray Transmission Characteristics. International Journal of Optomechatronics. 2011;5(2):136-54.
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Refrences
Title Journal Journal Categories Citations Publication Date
10.1117/12.417225 2001
10.1117/12.417225 2001
10.1117/12.417225 1999
Phase-contrast x-ray imaging for nondestructive evaluation of materials

 Journal of Applied Physics
  • Science: Chemistry: Physical and theoretical chemistry
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
 20 2006
10.1016/S1007-0214(06)70255-3