Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry
Article Properties
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LanguageEnglish
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DOI (url)
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Publication Date2010/05/28
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Indian UGC (journal)
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Refrences16
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Citations15
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Katsuichi Kitagawa
Cite
Kitagawa, Katsuichi. “Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry”. International Journal of Optomechatronics, vol. 4, no. 2, 2010, pp. 136-5, https://doi.org/10.1080/15599612.2010.484522.
Kitagawa, K. (2010). Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry. International Journal of Optomechatronics, 4(2), 136-156. https://doi.org/10.1080/15599612.2010.484522
Kitagawa K. Fast Surface Profiling by Multi-Wavelength Single-Shot Interferometry. International Journal of Optomechatronics. 2010;4(2):136-5.
Journal Categories
Science
Physics
Optics
Light
Technology
Electrical engineering
Electronics
Nuclear engineering
Electric apparatus and materials
Electric circuits
Electric networks
Technology
Electrical engineering
Electronics
Nuclear engineering
Electronics
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
Technology
Engineering (General)
Civil engineering (General)
Technology
Engineering (General)
Civil engineering (General)
Applied optics
Photonics
Technology
Mechanical engineering and machinery
Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| Title | 2009 | |||
| Title | 2009 | |||
| Title | Optical Engineering |
| 1984 | |
| 10.1109/ISOT.2009.5326095 | ||||
| Spatial fringe scanning for optical phase measurement | Optics Communications |
| 34 | 1984 |
Citations
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
Mesoscale standing wave imaging | Journal of Microscopy |
| 2023 | |
An evaluation of multi-excitation-wavelength standing-wave fluorescence microscopy (TartanSW) to improve sampling density in studies of the cell membrane and cytoskeleton | Scientific Reports |
| 2 | 2021 |
Panoramic dual-directional shearography assisted by a bi-mirror | Applied Optics |
| 1 | 2020 |
Kombination eines neuartigen Doppelpuls-RGB-Interferometers mit einem Hartmann-Shack-Wellenfrontsensor zur dynamischen flächenhaften Topographieerfassung | tm - Technisches Messen |
| 1 | 2020 |
| Accurate determination of two-dimensional thin film thickness in spectroscopic imaging reflectometer using color camera and tunable aperture | Optics Communications |
| 3 | 2019 |
Citations Analysis
The category
Technology: Engineering (General). Civil engineering (General): Applied optics. Photonics 11
is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Multiwavelength-integrated local model fitting method for interferometric surface profiling and was published in 2012. The most recent citation comes from a 2023 study titled Mesoscale standing wave imaging. This article reached its peak citation in 2019, with 3 citations. It has been cited in 10 different journals, 20% of which are open access. Among related journals, the Applied Optics cited this research the most, with 6 citations. The chart below illustrates the annual citation trends for this article.