Electromigration Lifetime of Penta-Twinned Gold Nanowires: Implications for Flexible Electronics

Article Properties
  • Language
    English
  • Publication Date
    2024/03/14
  • Indian UGC (journal)
  • Refrences
    52
  • Mohammad Waliullah Department of Mechanical Engineering, The University of Texas at Dallas, 800 W Campbell Road, Richardson, Texas 75080, United States
  • Al-Mustasin Abir Hossain Department of Mechanical Engineering, The University of Texas at Dallas, 800 W Campbell Road, Richardson, Texas 75080, United States ORCID
  • Brizeida Ojeda Department of Mechanical Engineering, The University of Texas at Dallas, 800 W Campbell Road, Richardson, Texas 75080, United States
  • Nahiyan Muzaffar Department of Mechanical Engineering, The University of Texas at Dallas, 800 W Campbell Road, Richardson, Texas 75080, United States
  • Rodrigo A. Bernal Department of Mechanical Engineering, The University of Texas at Dallas, 800 W Campbell Road, Richardson, Texas 75080, United States ORCID
Cite
Waliullah, Mohammad, et al. “Electromigration Lifetime of Penta-Twinned Gold Nanowires: Implications for Flexible Electronics”. ACS Applied Nano Materials, vol. 7, no. 7, 2024, pp. 6906-15, https://doi.org/10.1021/acsanm.3c05847.
Waliullah, M., Hossain, A.-M. A., Ojeda, B., Muzaffar, N., & Bernal, R. A. (2024). Electromigration Lifetime of Penta-Twinned Gold Nanowires: Implications for Flexible Electronics. ACS Applied Nano Materials, 7(7), 6906-6915. https://doi.org/10.1021/acsanm.3c05847
Waliullah, Mohammad, Al-Mustasin Abir Hossain, Brizeida Ojeda, Nahiyan Muzaffar, and Rodrigo A. Bernal. “Electromigration Lifetime of Penta-Twinned Gold Nanowires: Implications for Flexible Electronics”. ACS Applied Nano Materials 7, no. 7 (2024): 6906-15. https://doi.org/10.1021/acsanm.3c05847.
Waliullah M, Hossain AMA, Ojeda B, Muzaffar N, Bernal RA. Electromigration Lifetime of Penta-Twinned Gold Nanowires: Implications for Flexible Electronics. ACS Applied Nano Materials. 2024;7(7):6906-15.
Journal Categories
Science
Chemistry
Technology
Chemical technology
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
Refrences
Title Journal Journal Categories Citations Publication Date
International Series on Advances in Solid State Electronics and Technology 2010
Current at the Nanoscale 2012
Statistical Distributions 2011
Electronic Thin-Film Reliability 2010
10.1109/IRPS.2012.6241868