Analysis of Si, Cu, and Their Oxides by X-ray Photoelectron Spectroscopy

Article Properties

• Language

  English
• DOI (url)

  10.1021/acs.jchemed.3c00848
• Publication Date

  2024/02/22
• Journal

  Journal of Chemical Education
• Indian UGC (journal)
• Refrences

  36
• Jiachen Li Department of Chemistry and Bio-X, Stanford University, Stanford, California 94305, United StatesDepartment of Materials Science and Engineering, Stanford University, Stanford, California 94305, United StatesDepartment of Chemistry, Northwestern University, Evanston, Illinois 60208, United States
• Guanzhou Zhu Department of Chemistry and Bio-X, Stanford University, Stanford, California 94305, United StatesDepartment of Nuclear Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States
• Peng Liang Department of Chemistry and Bio-X, Stanford University, Stanford, California 94305, United StatesDepartment of Materials Science and Engineering, Stanford University, Stanford, California 94305, United StatesDepartment of Chemistry, The University of Hong Kong, Hong Kong, Hong Kong 999077, China
• Hongjie Dai Department of Chemistry and Bio-X, Stanford University, Stanford, California 94305, United StatesDepartment of Chemistry, The University of Hong Kong, Hong Kong, Hong Kong 999077, China ORCID