High-resolution studies of interfaces in materials science
Article Properties
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LanguageEnglish
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DOI (url)
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Publication Date1986/08/01
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Indian UGC (journal)
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Refrences11
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R.W. Carpenter
Abstract
Cite
Carpenter, R.W. “High-Resolution Studies of Interfaces in Materials Science”. Proceedings, Annual Meeting, Electron Microscopy Society of America, vol. 44, 1986, pp. 400-3, https://doi.org/10.1017/s0424820100143602.
Carpenter, R. (1986). High-resolution studies of interfaces in materials science. Proceedings, Annual Meeting, Electron Microscopy Society of America, 44, 400-403. https://doi.org/10.1017/s0424820100143602
Carpenter, R.W. “High-Resolution Studies of Interfaces in Materials Science”. Proceedings, Annual Meeting, Electron Microscopy Society of America 44 (1986): 400-403. https://doi.org/10.1017/s0424820100143602.
Carpenter R. High-resolution studies of interfaces in materials science. Proceedings, annual meeting, Electron Microscopy Society of America. 1986;44:400-3.
Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
| Title | 1983 | |||
| Title | 1984 | |||
| 10.1016/0036-9748(71)90189-X | ||||
| 10.1007/BF02662647 | ||||
| Non-equilibrium phase distribution in an Al-SiC composite | Materials Science and Engineering | 122 | 1985 |