| MMatch: Semi-supervised discriminative representation learning for multi-view classification | IEEE Transactions on Circuits and Systems for Video Technology |
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| | 2022 |
| Ensemble of feature selection algorithms: a multi-criteria decision-making approach | International Journal of Machine Learning and Cybernetics |
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
- Technology: Mechanical engineering and machinery
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
| 41 | 2022 |
| CTNet: Context-based tandem network for semantic segmentation | IEEE Transactions on Pattern Analysis and Machine Intelligence |
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Mechanical engineering and machinery
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| | 2021 |
| Joint consensus and diversity for multi-view semi-supervised classification | Machine Learning |
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
- Technology: Mechanical engineering and machinery
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| 19 | 2020 |
| Semi-supervised multi-view deep discriminant representation learning | IEEE Transactions on Pattern Analysis and Machine Intelligence |
- Science: Mathematics: Instruments and machines: Electronic computers. Computer science
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
- Technology: Mechanical engineering and machinery
- Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
- Technology: Engineering (General). Civil engineering (General)
| | 2020 |