The effects of deep levels in GaAs MESFETs

Article Properties
Cite
Zylberstejn, A. “The Effects of Deep Levels in GaAs MESFETs”. Physica B+C, vol. 117-118, 1983, pp. 44-49, https://doi.org/10.1016/0378-4363(83)90437-0.
Zylberstejn, A. (1983). The effects of deep levels in GaAs MESFETs. Physica B+C, 117-118, 44-49. https://doi.org/10.1016/0378-4363(83)90437-0
Zylberstejn A. The effects of deep levels in GaAs MESFETs. Physica B+C. 1983;117-118:44-9.
Refrences
Title Journal Journal Categories Citations Publication Date
10.1109/T-ED.1982.20789 IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
1982
Below 20 ps/gate operation with GaAs SAINT FETs at room temperature Electronics Letters
  • Technology: Electrical engineering. Electronics. Nuclear engineering
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
3 1982
Silicon implanted super low-noise GaAs MESFET Electronics Letters
  • Technology: Electrical engineering. Electronics. Nuclear engineering
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
17 1982
10.1109/T-ED.1981.20447 IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
1981
10.1109/EDL.1980.25310 IEEE Electron Device Letters
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
1980
Citations
Title Journal Journal Categories Citations Publication Date
Effect of doping on the forward current-transport mechanisms in a metal–insulator–semiconductor contact to InP:Zn grown by metal organic vapor phase epitaxy Solid-State Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Science: Physics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Chemical technology
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
  • Science: Physics
1998
Surface passivation of GaAs MESFETs IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
10 1997
Origins and characterization of low-frequency noise in GaAs MESFET's grown on InP substrates IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
8 1996
Numerical analysis of frequency dispersion of transconductance in GaAs MESFETs IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
10 1996
Surface influence on the conductance DLTS spectra of GaAs MESFET's IEEE Transactions on Electron Devices
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks
  • Science: Physics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
  • Technology: Electrical engineering. Electronics. Nuclear engineering: Electronics
1986
Citations Analysis
The category Technology: Electrical engineering. Electronics. Nuclear engineering: Electric apparatus and materials. Electric circuits. Electric networks 5 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Surface influence on the conductance DLTS spectra of GaAs MESFET's and was published in 1986. The most recent citation comes from a 1998 study titled Effect of doping on the forward current-transport mechanisms in a metal–insulator–semiconductor contact to InP:Zn grown by metal organic vapor phase epitaxy. This article reached its peak citation in 1996, with 2 citations. It has been cited in 2 different journals. Among related journals, the IEEE Transactions on Electron Devices cited this research the most, with 4 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year