Scanning tunneling microscopy study of fullerenes

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Sakurai, T. “Scanning Tunneling Microscopy Study of Fullerenes”. Progress in Surface Science, vol. 51, no. 4, 1996, pp. 263-08, https://doi.org/10.1016/0079-6816(96)00005-6.
Sakurai, T. (1996). Scanning tunneling microscopy study of fullerenes. Progress in Surface Science, 51(4), 263-408. https://doi.org/10.1016/0079-6816(96)00005-6
Sakurai T. Scanning tunneling microscopy study of fullerenes. Progress in Surface Science. 1996;51(4):263-408.
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Citations
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Citations Analysis
The category Science: Chemistry 59 is the most commonly referenced area in studies that cite this article. The first research to cite this article was titled Interaction of C60 with the (3×3) and (√3×√3) surfaces of 6H-SiC(0001): Adsorption, decomposition, and SiC growth and was published in 1997. The most recent citation comes from a 2023 study titled Positional and Rotational Molecular Degrees of Freedom at a Roughened Metal–Organic Interface: The Copper–Fullerene System and Its Multiple Structural Phases. This article reached its peak citation in 2007, with 10 citations. It has been cited in 57 different journals, 5% of which are open access. Among related journals, the Physical Review B cited this research the most, with 12 citations. The chart below illustrates the annual citation trends for this article.
Citations used this article by year