Preferential sputtering in binary targets
Article Properties
-
LanguageEnglish
-
DOI (url)
-
Publication Date1995/06/01
-
Journal
-
Indian UGC (journal)
-
Refrences95
-
Vladimir I. Zaporozchenko
-
Maria G. Stepanova
Cite
Zaporozchenko, Vladimir I., and Maria G. Stepanova. “Preferential Sputtering in Binary Targets”. Progress in Surface Science, vol. 49, no. 2, 1995, pp. 155-96, https://doi.org/10.1016/0079-6816(95)00036-x.
Zaporozchenko, V. I., & Stepanova, M. G. (1995). Preferential sputtering in binary targets. Progress in Surface Science, 49(2), 155-196. https://doi.org/10.1016/0079-6816(95)00036-x
Zaporozchenko VI, Stepanova MG. Preferential sputtering in binary targets. Progress in Surface Science. 1995;49(2):155-96.
Journal Categories
Science
Chemistry
Physical and theoretical chemistry
Science
Physics
Technology
Chemical technology
Technology
Electrical engineering
Electronics
Nuclear engineering
Materials of engineering and construction
Mechanics of materials
You May Also Like
- QUANTUM ESPRESSO: a modular and open-source software project for quantum simulations of materials
- The SIESTA method forab initioorder-Nmaterials simulation
- First-principles simulation: ideas, illustrations and the CASTEP code
- Hierarchical structure in financial markets
- Predicting missing links via local information
Refrences
| Title | Journal | Journal Categories | Citations | Publication Date |
|---|---|---|---|---|
Quantitative Auger electron spectroscopy of TiSiy: Peak height, line-shape, and sputtering yield analyses | Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films |
| 10 | 1989 |
| Summary Abstract: Deconvolution of concentration depth profiles from angle-resolved XPS data | Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films |
| 4 | 1985 |
Preferential sputtering of brass studied by AES and XPS | Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films |
| 11 | 1984 |
Differential sputtering and surface segregation: The role of enhanced diffusion | Journal of Vacuum Science and Technology | 176 | 1981 | |
| 10.1016/0168-583X(94)95595-6 | 1994 |
Refrences Analysis
The category
Science: Physics 66
is the most frequently represented among the references in this article. It primarily includes studies from Surface Science The chart below illustrates the number of referenced publications per year.