Title | Journal | Journal Categories | Citations | Publication Date |
---|---|---|---|---|
10.1007/BF02646387 | 1978 | |||
The quantitative analysis of thin specimens | Journal of Microscopy |
| 1,432 | 1975 |
J. I. Goldstein, J. L. Costley, G. W. Lorimer, and S. J. B. Reed:Scanning Electron Micros., 1977, vol. 1, pp. 315–24. | 1977 | |||
Elements of X-ray Diffraction | 1967 | |||
Proc. 35th Ann. Conf., Electron Microscopy Soc. Amer. | 1977 |