Russian Microelectronics

Title Publication Date Language Citations
Diagnostics of degradation processes in the metal-semiconductor system2012/01/01English5
Fabrication of Strain-Relaxed Si1 − x Gex/Si(001) Buffer Layers of Low Surface Roughness2005/07/01English5
Square-Membrane Deflection and Stress: Identifying the Validity Range of a Calculation Procedure2005/05/01English4
Electrical properties of a TiN/Ti x Al1 – x O y /TiN memristor device manufactured by magnetron sputtering2016/11/01English4
Ring voltage controlled oscillator for high-speed PLL systems2014/11/14English3
Quantum-aperture formation in a quasi-ballistic MESFET by neutron irradiation2005/11/01English3
Evaluating the reading sensitivity of a new thermomechanical data-storage technique2005/11/01English3
Parts screening for ESD susceptibility2005/01/01English3
To the Issue of the Memristor’s HRS and LRS States Degradation and Data Retention Time2021/09/01English3
GaAs Pixel-Detector Technology for X-ray Medical Imaging: A Review2005/07/01English3
Borophosphosilicate glass films in silicon microelectronics, part 2: Structure and applications2005/03/01English3
Adjusting the Spectral Response of Silicon Photodiodes by Additional Dopant Implantation2005/05/01English3
Physical Principles of Laser Simulation for the Transient Radiation Response of Semiconductor Structures, Active Circuit Elements, and Circuits: A Linear Model2004/03/01English2
Making Anodic Alumina Thin Films Having a Pore Array2005/05/01English2
Response Mechanism of the Base-in-Well Bipolar Magnetotransistor2005/05/01English2
Modeling the Energy Structure of a GaN p–i–n Junction2018/12/01English2
An Integrated High-Capacitance Varicap Based on Porous Silicon2018/11/01English2
Structural Strength and Temperature Condition of Multi-Chip Modules2018/11/01English2
SOI/SOS MOSFET compact macromodel taking into account radiation effects2011/12/01English2
Extracting the fitting parameters for the conversion model of enhanced low dose rate sensitivity in bipolar devices2013/01/01English2
Electrophysical Parameters and Radiation Spectra of Boron Trichloride Plasma2018/03/01English2
Study of the Magneto-Optical Properties of Structures on Curved Surfaces for Creating Memory Elements on Magnetic Vortices2020/09/01English2
Laser simulation of ionizing-radiation effects on silicon ICs: The temperature and doping-level dependence of simulation parameters2005/11/01English2
Nonvolatile memory cells based on the effect of resistive switching in depth-graded ternary Hf x Al1 − x O y oxide films2014/07/01English2
Probe modification for scanning-probe microscopy by the focused ion beam method2012/01/01English2
Evaluating the effect of temperature on the accuracy of laser simulation of the transient radiation response in semiconductor devices and circuits2008/01/01English2
Structuring Copper in the Plasma Medium of a High-Frequency Discharge2018/07/01English2
Electron Cyclotron Resonance Used in Low-Pressure Microwave Plasma Reactors with Permanent Magnets2005/07/01English2
Physical principles of laser simulation for the transient radiation response of semiconductor structures, active circuit elements, and circuits: A nonlinear model2006/05/01English2
Concerning the Effect of Type of Fluorocarbon Gas on the Output Characteristics of the Reactive-Ion Etching Process2020/05/01English2