IFEFFIT : interactive XAFS analysis and FEFF fitting

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Newville, Matthew. “IFEFFIT : Interactive XAFS Analysis and FEFF Fitting”. Journal of Synchrotron Radiation, vol. 8, no. 2, 2001, pp. 322-4, https://doi.org/10.1107/s0909049500016964.
Newville, M. (2001). IFEFFIT : interactive XAFS analysis and FEFF fitting. Journal of Synchrotron Radiation, 8(2), 322-324. https://doi.org/10.1107/s0909049500016964
Newville M. IFEFFIT : interactive XAFS analysis and FEFF fitting. Journal of Synchrotron Radiation. 2001;8(2):322-4.
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Description

Looking for an interactive and versatile tool for XAFS analysis? This paper introduces IFEFFIT, a program and library combining AUTOBK and FEFFIT algorithms with interactive graphics and data manipulation capabilities for XAFS analysis. IFEFFIT is scriptable and comes with a command-line program usable in both interactive and batch modes. Additionally, it provides a function library accessible from C, Fortran, Tcl, Perl, and Python, facilitating the creation of Graphical User Interfaces for rapid data analysis. Using this library, a Graphical User Interface for rapid 'online' data analysis is demonstrated. IFEFFIT is open-source, encouraging widespread use, collaborative development, and contributions. With its interactive capabilities and flexible scripting, IFEFFIT is a valuable resource for researchers.

Published in the Journal of Synchrotron Radiation, this paper directly addresses the journal's focus on advancements in synchrotron radiation techniques and their applications. By introducing IFEFFIT, a new software package for XAFS data analysis, the paper provides a valuable tool for the synchrotron radiation community. The open-source nature of IFEFFIT also aligns with the journal's goal of promoting collaboration and innovation in the field.

Citations
Citations Analysis
The first research to cite this article was titled Surface Morphology and Structural Investigation of TiN Nanocrystal Thin Films Grown with Different N<sub>2</sub> Concentration and was published in 2013. The most recent citation comes from a 2023 study titled Surface Morphology and Structural Investigation of TiN Nanocrystal Thin Films Grown with Different N<sub>2</sub> Concentration . This article reached its peak citation in 2021 , with 9 citations.It has been cited in 21 different journals, 9% of which are open access. Among related journals, the The Journal of Physical Chemistry C cited this research the most, with 12 citations. The chart below illustrates the annual citation trends for this article.
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