Journal of Electron Microscopy

Title Publication Date Language Citations
Remineralization effects of xylitol on demineralized enamel2003/11/20English39
Advances in SEM-based diffraction studies of defects and strains in semiconductors2000/01/01English38
Simulation Study on Image Contrast and Spatial Resolution in Helium Ion Microscope2007/10/01English38
Effect of surface lipopolysaccharide on the nature of membrane vesicles liberated from the Gram-negative bacterium Pseudomonas aeruginosa2003/11/20English37
Structures and magnetic properties of oriented Fe/Au and Fe/Pt nanoparticles on a-Al2O31999/01/01English35
Atomic force microscopy in structural biology: from the subcellular to the submolecular2000/01/01English35
Atomic resolution HVEM and environmental noise1999/01/01English35
Helical nanotubes of hexagonal boron nitride1997/01/01English34
An ultrastructural study of age-related changes in mouse olfactory epithelium1999/01/01English34
Morphological study of acoustic liposomes using transmission electron microscopy2009/11/11English33
Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling2004/10/01English33
Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy2010/04/05English33
Ultrastructure and behavior of actin cytoskeleton during cell wall formation in the fission yeast Schizosaccharomyces pombe2003/05/28English33
Effects of micafungin on the morphology of Aspergillus fumigatus2005/01/01English33
Development of a new 3 MV ultra-high voltage electron microscope at Osaka University1997/01/01English33
New Trends in STEM-Based Nano-EELS Analysis1996/02/01English33
Time-lapse viscoelastic imaging of living fibroblasts using force modulation mode in AFM2000/01/01English33
Measurement of mean free paths for inelastic electron scattering of Si and SiO22002/05/2832
Optimization of TEm specimen preparation by double-sided ion beam thinning under low angles1999/01/01English32
A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope1999/01/01English32
Review Caveolae: from a morphological point of view1998/01/01English32
Zero loss peak deconvolution for bandgap EEL spectra2000/01/01English32
Morphology and structure of various phases at the bonding interface of Al/steel formed by explosive welding2000/01/01English32
Autophagy in transition from hypertrophic cardiomyopathy to heart failure2009/09/30English32
Development of an analytical environmental TEM system and its application2009/06/11English32
FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si1997/01/01English31
Production of electron vortex beams carrying large orbital angular momentum using spiral zone plates2012/03/06English31
Elastic strain tensor measurement using electron backscatter diffraction in the SEM2010/07/15English31
Imaging the interaction between dengue 2 virus and human blood platelets using atomic force and electron microscopy2008/03/03English30
First observation of SiO2/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy2003/03/2430