IEEE Transactions on Reliability

Title Publication Date Language Citations
Computationally-efficient phased-mission reliability analysis for systems with variable configurations1992/01/0150
A maintenance policy for repairable systems based on opportunistic failure-rate tolerance1991/06/0150
A Birnbaum-Saunders accelerated life model2000/06/0150
Topological optimization of a reliable communication network1998/01/0149
Experimental results on preprocessing of path/cut terms in sim of disjoint products technique1993/03/0149
Phased-mission system reliability under Markov environment1994/06/0149
Importance and sensitivity analysis in assessing system reliability1990/04/0149
A Bayes approach to step-stress accelerated life testing1996/01/0149
Reliability growth of fault-tolerant software1993/06/0148
Framework for modeling software reliability, using various testing-efforts and fault-detection rates2001/01/0148
On-line hazard aversion and fault diagnosis in chemical processes: the digraph+fault-tree method1988/06/0147
An inspection model with minimal and major maintenance for a system with deterioration and Poisson failures2000/03/0147
The exponentiated Weibull family: a graphical approach1999/03/0147
Optimum constant-stress accelerated life-test plans1994/01/0147
Analysis of step-stress accelerated-life-test data: a new approach1996/03/0147
Reliability analysis of interconnection networks using hierarchical composition1989/04/0146
A failure-repair model with minimal and major maintenance1993/03/0146
Error log analysis: statistical modeling and heuristic trend analysis1990/01/0146
Step-stress life-testing with random stress-change times for exponential data1999/06/0146
Weighted voting systems1999/03/0146
Simple enumeration of minimal cutsets of acyclic directed graph1988/01/0146
Approximate MLEs for the location and scale parameters of the half-logistic distribution with type-II right-censoring1991/06/0146
Comparison of electronics-reliability assessment approaches1993/01/0146
Multistate consecutively-connected systems1989/01/0146
Fault-tolerant evolvable hardware using field-programmable transistor arrays2000/01/0145
Power-hierarchy of dependability-model types1994/01/0145
Approximate MLE of the scale parameter of the Rayleigh distribution with censoring1989/01/0145
Efficient object-oriented integration and regression testing2000/03/0145
A survey of reliability-prediction procedures for microelectronic devices1992/03/0145
Robust estimation of the Birnbaum-Saunders distribution1998/03/0144