Journal of Applied Crystallography

Title Publication Date Language Citations
A texture goniometer with variable radius and collimation for analysis of textures in rocks1979/12/01
Données cristallographiques de l'octohydrate du métagallate(III) de lithium1980/02/01
A semiautomatic coordinate measuring device for molecular models1979/02/01
Huang scattering from Frenkel defects in electron-irradiated f.c.c metals1975/04/01
Some goemetrical problems related to the rotation camera. II. Dimensions of integration domains for intensity measurements1985/12/01
Compilation of Temperature Factors for Elements and Binary Compunds1985/12/01
New Commercial Products1990/10/01
On the calculation of diffracted intensities from SiC crystals undergoing 2Hto 6Htransformation by the layer displacement mechanism1988/12/01
DECA-ZONAX:a program for indexing zone-axis patterns of decagonal quasicrystals1998/10/01
New X-ray Hystar range of high-performance image detectors2001/11/17
A method for the rapid orientation of back-reflection Laue X-ray photographs for zinc1974/02/01
Model drawing programs:production of diperiodic patterns1976/02/01
A miniature goniometer head1975/02/01
The Use of Partial Reflections for Scaling and Averaging X-ray Area-Detector Data1998/10/01
Automated and graphical methods for locating heavy-atom sites for isomorphous replacement and multiwavelength anomalous diffraction phase determination1998/04/01
Direct detection of the protein quaternary structure and denatured entity by small-angle scattering: guanidine hydrochloride denaturation of chaperonin protein GroEL2002/01/22
Crystallographers1971/02/01
X-ray Fine Structure Investigation of Germanium Nanoclusters1998/08/01
Generation of α-SiC stacking sequences1970/10/01
Wolfram Prandl (1935–2001)2002/01/22
Profile refinement of multiple-wavelength neutron powder data1979/12/01
An improved program for searching and matching of X-ray powder diffraction patterns1983/02/01
Small-angle scattering studies on clathrin-coated vesicles1991/10/01
Refinement of the crystal orientation matrix for the flat-cone diffractometer1982/02/01
On the separation of split diffuse intensity maxima from a disordered Cu–Au alloy by an X-ray counter method1986/08/01
A new CeO2form obtained as oxidation product of CeO2+SiO2-doped hot-pressed silicon nitride1982/02/01
Analysis of time-resolved powder diffraction data using a pattern-decomposition method with restraints1993/06/01
Dispositif d'orientation rapide de cristaux par la méthode de Laue1989/10/01
Therman Expansion and Crystal Chemistry of (Sr1−x , K2x )Zr4(PO4)6 Ceramic1995/10/01
MRIA- a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra1992/06/01