Journal of Applied Crystallography

Title Publication Date Language Citations
Crystal data for zinc oxysulphate [Zn3O(SO4)2]1977/02/01
The heavy-atom method without Patterson. A symmetry sum function1989/04/01
A multiple-crystal data-collection method in time-of-flight neutron Laue diffraction1997/04/01
Constantes cristallographiques de CuSe2O5, CuSeO3et Cu2SeO41976/08/01
Thermal expansion of the Ag3Mg alloy in the ordered and disordered states1969/08/01
Crystal data of new basic alkali cobalt(II) sulphates1970/06/01
A universal high-temperature device for single-crystal diffraction1978/08/01
Small-angle scattering curves of concentrated polymer solutions1978/10/01
Tailoring beams for small-angle neutron diffractometers1988/12/01
Analysis of Small-Angle Scattering Data from Spherical Particles by both the Indirect Transform Method and the Maximum-Entropy Method1997/06/01
Performance of a New Small-Angle Neutron Scattering Instrument at the Malaysian TRIGA Reactor1997/10/01
The Analysis of Small-Angle Scattering Data from Polydisperse Rodlike Particles by Indirect Transform and Maximum-Entropy Methods1996/04/01
Crystal data for ammonium thiosulphate: (NH4)2S2O31978/12/01
Qualitative and quantitative morphological study on α and β phases of ammonium pentaborate tetrahydrate1983/12/01
Crystal data for bis(η5-tert-butylcyclopentadienyl)hafnium(IV) dihydride dimer, [(η5-t-BuC5H4)2HfH(μ-H)]21983/04/01
Kinetics of pH changes in the vapor diffusion method of protein crystallization using ammonium sulfate as the precipitant1991/04/01
Powder diffraction beyond the Bragg law: study of palladium nanocrystals2000/10/01
The determination of particle size distributions in small-angle scattering using the maximum-entropy method1992/08/01
Lattice parameters of some binary and ternary copper alloys1975/08/01
X-ray Rietveld Analysis with a Physically Based Background1995/04/01
Optimization of the experimental resolution for small-angle scattering1984/08/01
Electron microscope and diffraction study on the ordered structures of platinum-rich copper–platinum alloys1974/02/01
An analysis of the Rietveld refinement method1979/12/01
Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects1999/08/01
A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. II. Application and discussion of the methodology1988/10/01
On a small error in SRM640, SRM640a and SRM640b lattice parameters1993/04/01
Determination of the thermal expansion of orthorhombic sulfur1986/08/01
Fractal properties of a partially crystalline zirconium oxide aerogel1993/10/01
Applicabilities of the Warren–Averbach analysis and an alternative analysis for separation of size and strain broadening1994/06/01
On the existence of copper cobaltite1972/02/01