Journal of Electronic Testing

Title Publication Date Language Citations
Test Technology Newsletter2023/04/01English
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration2024/02/21English
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm2024/04/12English
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission2024/04/04English
Instant Test and Repair for TSVs using Differential Signaling2024/04/03English
Performance Efficient and Fault Tolerant Approximate Adder2023/12/01English
Efficient Fault Detection by Test Case Prioritization via Test Case Selection2023/11/22English
Editorial2023/12/01English
2022 JETTA-TTTC Best Paper Award2023/12/01English
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms2023/10/24English
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET2024/03/28English
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs2024/03/21English
2023 JETTA Reviewers2024/03/21English
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach2024/03/20English
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing2024/03/23English
Editorial2024/03/14English
Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm2023/02/01English
Editorial2023/02/01English
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection2023/06/01English
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm2023/06/01English
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing2023/06/01English
DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram2023/02/01English
A Complete Design-for-Test Scheme for Reconfigurable Scan Networks2022/12/01English
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application2024/04/17English
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs2024/04/23English
A Survey and Recent Advances: Machine Intelligence in Electronic Testing2024/04/15English
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis2024/04/16English
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells2023/09/15English
Diagnosis of Analog and Digital Circuit Faults Using Exponential Deep Learning Neural Network2023/08/01English
Efficient Test and Characterization of Space Transmit-Receive Modules Using Scalable and Multipurpose Automated Test System2023/08/01English