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Journal Properties
Number of Articles
16
e-ISSN
0860-8229
Publisher
Polish Academy of Sciences Chancellery
Indian UGC
DOAJ (latest)
Description
Metrology and Measurement Systems is a peer-reviewed journal dedicated to the advancement of measurement science and technology. This publication serves as a vital resource for researchers, engineers, and professionals seeking innovative solutions and methodologies in diverse fields of metrology, playing a crucial role in ensuring accuracy, reliability, and standardization across various industries.
The journal showcases original research articles, reviews, and case studies covering topics such as dimensional metrology, electrical measurements, optical metrology, and force and mass measurements. It emphasizes the development of new measurement techniques, uncertainty analysis, and the application of metrology in industrial and scientific settings. Indexed in databases like Scopus and Web of Science.
Metrology and Measurement Systems remains at the forefront of measurement innovation, fostering advancements in the field. Consider submitting your work to contribute to the ongoing evolution of metrology and measurement science, enhancing the precision and reliability of measurements worldwide.