The Journal of Electronic Testing: Theory and Applications (JETTA) offers a platform for disseminating novel and significant research on all aspects of electronic testing. It focuses on the theory, practice, and application of testing techniques for electronic devices, circuits, and systems. It investigates topics like fault modeling, test generation, design-for-testability (DFT), built-in self-test (BIST), and verification methodologies.
JETTA covers the entire spectrum of electronic testing, from theoretical foundations to practical industrial applications. Emphasis is placed on new approaches for improving test quality, reducing test cost, and addressing challenges posed by emerging technologies, such as nanometer-scale devices and 3D integrated circuits. The journal is targeted towards researchers, engineers, and practitioners involved in the design, manufacturing, and testing of electronic products.
By providing a forum for the exchange of ideas and the dissemination of cutting-edge research, JETTA aims to advance the state of the art in electronic testing and contribute to the development of more reliable and cost-effective electronic systems. Original research articles, reviews, and tutorial papers are all welcome.