Please log in to save bookmarks. Only registered users can save their favorite pages.
Journal Properties
Continued as
Microscopy (Oxford, England)
Language
English
Number of Articles
3,188
Abbreviation
J Electron Microsc (Tokyo)
ISSN
0022-0744
e-ISSN
1477-9986
Main Publisher
Japanese Society of Microscopy
Publisher
Oxford University Press (OUP)
Indian UGC
DOAJ (latest)
Description
The Journal of Electron Microscopy is a leading international forum for the dissemination of cutting-edge research in all aspects of electron microscopy, including instrumentation, techniques, and applications across a broad range of scientific disciplines. With a focus on advancing the field, the journal publishes high-quality original research articles, reviews, and technical notes that showcase the latest developments and innovative uses of electron microscopy.
Key areas of coverage include materials science, biological sciences, and nanostructure materials. The journal particularly emphasizes studies that explore the structure and function of biological specimens, the characterization of novel materials, and the development of advanced imaging and analytical techniques. Indexed in major databases, the Journal of Electron Microscopy serves a global audience of researchers in academia and industry.
Researchers are encouraged to submit their novel findings that highlight the power of electron microscopy in addressing fundamental questions in science and technology. By fostering collaboration and knowledge exchange, the journal plays a critical role in pushing the boundaries of electron microscopy and its diverse applications.